光刻技术L1
1.學(xué)習(xí)目標(biāo)
了解光刻的整體概念
● 概述光致抗蝕劑,包括正抗蝕劑和負(fù)抗蝕劑 photoresist光致抗蝕劑 就是光刻膠
● 回顧光刻步驟
● 回顧光刻技術(shù),包括不同的設(shè)備
2.光刻蝕技術(shù)種類 Lithography types
1.光刻(SUSS MA6)
2.納米壓印光刻(EVG 520)
3.電子束光刻(Raith EBPG 5200)
1. Photo lithography (SUSS MA6)
2. Nanoimprint lithography (EVG 520)
3. Electron beam lithography (Raith EBPG 5200)
Photo-litho-graphy: Greek: light-stone-writing
Photolithography is an optical mean of transferring a designed pattern onto a wafer
Designs are usually done using a CAD tool
攝影石刻:希臘語(yǔ):輕石書(shū)寫(xiě)
光刻是一種將設(shè)計(jì)圖案轉(zhuǎn)移到晶圓上的光學(xué)方法
設(shè)計(jì)通常使用CAD工具完成
例子:膠卷攝影 PCB板 CAD設(shè)計(jì) lithograph掩膜
4.光刻晶體管
5.工藝流程
?使用CAD工具進(jìn)行設(shè)備/電路設(shè)計(jì)
掩模制造
?光刻曝光系統(tǒng)(紫外線)
?感光膜(光刻膠)
?晶片和掩模的對(duì)準(zhǔn)
?光刻膠的曝光
?開(kāi)發(fā)模式
?曝光后處理(金屬化、蝕刻),然后發(fā)射
?晶圓上的物理結(jié)構(gòu)
? Device/circuit design using a CAD tool
? Mask manufacturing
? Lithography exposure system (UV light)
? Photosensitive film (photoresist)
? Alignment of wafer and mask
? Exposure of the photoresist
? Development of pattern
? Post exposure processing (metallization, etching) followed by liftoff
? Physical structure on the wafer
Process flow
1.surface preparation
Cleaning is carried out to remove typical
contaminants from the surface prior to resist coating,
these include:
? Dust from wafer scribing
? Dust from the atmosphere
? Particles
? Lint from wipes
? Photoresist residue from previous processing
在進(jìn)行抗蝕涂層之前,進(jìn)行清潔以去除表面的典型污染物,
這些措施包括:
?晶圓劃片產(chǎn)生的灰塵
?大氣中的灰塵
?粒子
?濕巾上的棉絨
?先前處理產(chǎn)生的光刻膠殘留物
標(biāo)準(zhǔn)清洗流程
5 minute soak in acetone with ultrasonic agitation
5 minute soak in methanol with ultrasonic agitation
5 minute soak in isopropanol with ultrasonic agitation
30 seconds water rinse using de-ionised water
在丙酮中超聲攪拌浸泡5分鐘
用超聲波攪拌在甲醇中浸泡5分鐘
在超聲波攪拌下,在異丙醇中浸泡5分鐘
用去離子水沖洗30秒
硅片底漆
Adhesion promoters are used to assist resist coating
-Resist adhesion is affected by:
Moisture on the surface
?Type of primer
?Resist chemistry
?Surface smoothness
?Surface contamination
附著力促進(jìn)劑用于輔助抗蝕涂層
-抗蝕劑附著力受以下因素影響:
表面水分
?底漆類型
?抗化學(xué)
?表面光滑度
?表面污染
aligner對(duì)準(zhǔn)器 Diwater 去離子水
Illumination 照明
使用真空泵將晶片固定在卡盤(pán)上
分配覆蓋晶圓表面2/3的抗蝕劑
通常通過(guò)緩慢旋轉(zhuǎn)開(kāi)始,以均勻分布抗蝕劑(500 rpm)
然后是更快的旋轉(zhuǎn)(3000–5000 rpm)
速度決定厚度和均勻性
Wafer is held onto the chuck using vacuum pump
Dispense resist that covers 2/3 of the wafer surface area
Usually start by slow spin to distribute the resist evenly (500 rpm)
Followed by faster spin (3000 – 5000 rpm)
The speed determines thickness and uniformity
?
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